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1

[IEEE 2020 IEEE International Solid- State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2020.2.16-2020.2.20)] 2020 IEEE International Solid- State Circuits Conference - (ISSCC) - 28.2 A 51dB-SNR 120Hz-Scan-Rate 32Ã18 Segmented-VCOM LCD In-Cell Touch-Display-Driver IC with 96-Channel Compact Shunt-Sensing Self-Capacitance Analog Front-End

Jang, Hongjae, Shin, Hyungcheol, Lee, Jaemin, Yoo, Changwon, Chun, Kanghyup, Yun, Ilhyun

Year:

2020

File:

PDF, 1006 KB

2020

2

Plasma charging damage during over-etch time of aluminum

Hyungcheol Shin, Geunsook Park, Chenming Hu

Journal:

Solid-State Electronics

Year:

1998

Language:

english

File:

PDF, 209 KB

english, 1998

3

Investigation of Retention Characteristics for Trap-Assisted Tunneling Mechanism in Sub 20-nm NAND Flash Memory

Lee, Kyunghwan, Shin, Hyungcheol

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 828 KB

english, 2017

4

An analytical channel thermal noise model for deep-submicron MOSFETs with short channel effects

Jongwook Jeon, Jong Duk Lee, Byung-Gook Park, Hyungcheol Shin

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 167 KB

english, 2007

5

A simple four-terminal small-signal model of RF MOSFETs and its parameter extraction

Minkyu Je, Jeonghu Han, Hyungcheol Shin, Kwyro Lee

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 221 KB

english, 2003

6

Analytical drain thermal noise current model valid for deep submicron MOSFETs

Kwangseok Han, Hyungcheol Shin, Kwyro Lee

Journal:

IEEE Transactions on Electron Devices

Year:

2004

Language:

english

File:

PDF, 407 KB

english, 2004

7

Three-Dimensional nand Flash Architecture Design Based on Single-Crystalline STacked ARray

Yoon Kim, Jang-Gn Yun, Se Hwan Park, Wandong Kim, Joo Yun Seo, Myounggon Kang, Kyung-Chang Ryoo, Jeong-Hoon Oh, Jong-Ho Lee, Hyungcheol Shin, Byung-Gook Park

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 2.40 MB

english, 2012

8

[IEEE 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Long Beach, CA, USA (12-14 June 2005)] RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE Radio Frequency integrated Circuits - Analytical thermal noise model suitable for circuit design using short-channel MOSFETs

Jongwook Jeon,, Seyoung Kim,, In Man Kang,, Kwangsuk Han,, Kwyro Lee,, Hyungcheol Shin,

Year:

2005

Language:

english

File:

PDF, 550 KB

english, 2005

9

[IEEE 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. - Austin, TX, USA (2005.05.11-2005.05.11)] 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. - Extraction and modeling of gate electrode resistance in rf MOSFETs

Myounggon Kang,, In Man Kang,, Hyungcheol Shin,

Year:

2005

Language:

english

File:

PDF, 537 KB

english, 2005

10

[IEEE IEEE International Conference on Simulation of Semiconductor Processes and Devices - Boston, MA, USA (2003.09.3-2003.09.5)] International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. - Thermal noise modeling for short-channel MOSFETs

Kwangseok Han,, Kwyro Lee,, Hyungcheol Shin,

Year:

2003

Language:

english

File:

PDF, 451 KB

english, 2003

11

[IEEE IEEE MTT-S International Microwave Symposium - IMS 2003 - Philadelphia, PA, USA (8-13 June 2003)] IEEE MTT-S International Microwave Symposium Digest, 2003 - A scalable model for the substrate resistance in multi-finger RF MOSFETs

Jeonghu Han,, Hyungcheol Shin,

Year:

2003

Language:

english

File:

PDF, 233 KB

english, 2003

12

[IEEE 2017 Silicon Nanoelectronics Workshop (SNW) - Kyoto, Japan (2017.6.4-2017.6.5)] 2017 Silicon Nanoelectronics Workshop (SNW) - In-depth analysis of self-heating effects in vertical nanoplate-shaped GAAFETs

Son, Dokyun, Myeong, Ilho, Kim, Hyunsuk, Kang, Myounggon, Shin, Hyungcheol

Year:

2017

Language:

english

File:

PDF, 1.97 MB

english, 2017

13

Trench-type deep N-well dual guard ring for the suppression of substrate noise coupling

Yongho Oh, Seungyong Lee, Hyungcheol Shin, Jae-Sung Rieh

Journal:

International Journal of RF and Microwave Computer-Aided Engineering

Year:

2011

Language:

english

File:

PDF, 1.01 MB

english, 2011

14

A low power low noise amplifier with subthreshold operation in 130 nm CMOS technology

Ickhyun Song, Hee-Sauk Jhon, Hakchul Jung, Minsuk Koo, Hyungcheol Shin

Journal:

Microwave and Optical Technology Letters

Year:

2008

Language:

english

File:

PDF, 187 KB

english, 2008

15

The novel SCR-based ESD protection with low triggering and high holding voltages

Myounggon Kang, Ki-Whan Song, Byung-Gook Park, Hyungcheol Shin

Journal:

Microelectronics Journal

Year:

2011

Language:

english

File:

PDF, 496 KB

english, 2011

16

Drain current thermal noise modeling for deep submicron n- and p-channel MOSFETs

Kwangseok Han, Hyungcheol Shin, Kwyro Lee

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 371 KB

english, 2004

17

Small-signal modeling of MOSFET cascode with merged diffusion

Yeonam Yun, Hee-Sauk Jhon, Jongwook Jeon, Jaehong Lee, Hyungcheol Shin

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 619 KB

english, 2009

18

Improving the cell characteristics using arch-active profile in NAND flash memory having 60 nm design-rule

Daewoong Kang, Hyungcheol Shin

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 908 KB

english, 2010

19

Fabrication and characterization of fin SONOS flash memory with separated double-gate structure

Jang-Gn Yun, Yoon Kim, Il Han Park, Jung Hoon Lee, Sangwoo Kang, Dong-Hua Lee, Seongjae Cho, Doo-Hyun Kim, Gil Sung Lee, Won-Bo Sim, Younghwan Son, Hyungcheol Shin, Jong Duk Lee, Byung-Gook Park

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 717 KB

english, 2008

20

Extraction of trap energy and location from random telegraph noise in gate leakage current (Ig RTN) of metal–oxide semiconductor field effect transistor (MOSFET)

Heung-Jae Cho, Sanghoon Lee, Byung-Gook Park, Hyungcheol Shin

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 584 KB

english, 2010

21

Single-Crystalline Si STacked ARray (STAR) NAND Flash Memory

Jang-Gn Yun, Kim, G., Joung-Eob Lee, Yoon Kim, Won Bo Shim, Jong-Ho Lee, Hyungcheol Shin, Jong Duk Lee, Byung-Gook Park

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 1.41 MB

english, 2011

22

Characteristics of p-channel Si nano-crystal memory

Kwangseok Han, Ilgweon Kim, Hyungcheol Shin

Journal:

IEEE Transactions on Electron Devices

Year:

2001

Language:

english

File:

PDF, 157 KB

english, 2001

23

An RF model of the accumulation-mode MOS varactor valid in both accumulation and depletion regions

Seong-Sik Song, Hyungcheol Shin

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 474 KB

english, 2003

24

Independent Double-Gate Fin SONOS Flash Memory Fabricated With Sidewall Spacer Patterning

Jang-Gn Yun, Yoon Kim, Il Han Park, Jung Hoon Lee, Daewoong Kang, Myoungrack Lee, Hyungcheol Shin, Jong Duk Lee, Byung-Gook Park

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 1.09 MB

english, 2009

25

Temporal Noise Analysis and Reduction Method in CMOS Image Sensor Readout Circuit

Bong Chan Kim, Jongwook Jeon, Hyungcheol Shin

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 875 KB

english, 2009

26

A simple and analytical parameter-extraction method of a microwave MOSFET

Ickjin Kwon, Minkyu Je, Kwyro Lee, Hyungcheol Shin

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2002

Language:

english

File:

PDF, 302 KB

english, 2002

27

A Simple Figure of Merit of RF MOSFET for Low-Noise Amplifier Design

Ickhyun Song, Jongwook Jeon, Hee-Sauk Jhon, Junsoo Kim, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 149 KB

english, 2008

28

Complete high-frequency thermal noise modeling of short-channel MOSFETs and design of 5.2-GHz low noise amplifier

Kwangseok Han, Gil, J., Seong-Sik Song, Jeonghu Han, Hyungcheol Shin, Choong-Ki Kim, Kwyro Lee

Journal:

IEEE Journal of Solid-State Circuits

Year:

2005

Language:

english

File:

PDF, 895 KB

english, 2005

29

[Japan Soc. Appl. Phys 2002 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2002) - Kobe, Japan (4-6 Sept. 2002)] International Conferencre on Simulation of Semiconductor Processes and Devices - On the large-signal CMOS modeling and parameter extraction for RF applications

Minkyu Je,, Ickjin Kwon,, Jeonghu Han,, Hyungcheol Shin,, Kwyro Lee,

Year:

2002

Language:

english

File:

PDF, 259 KB

english, 2002

30

[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Investigation into the effect of the variation of gate dimensions on program characteristics in 3D NAND flash array

Seo, Joo Yun, Kim, Yoon, Park, Se Hwan, Kim, Wandong, Kim, Do-Bin, Lee, Jong-Ho, Shin, Hyungcheol, Park, Byung-Gook

Year:

2012

Language:

english

File:

PDF, 378 KB

english, 2012

31

Dependence on an oxide trap’s location of random telegraph noise (RTN) in GIDL current of n-MOSFET

Nguyen Gia, Quan, Yoo, Sung-Won, Lee, Hyunseul, Shin, Hyungcheol

Journal:

Solid-State Electronics

Year:

2014

Language:

english

File:

PDF, 1023 KB

english, 2014

32

Room temperature single electron effects in a Si nano-crystal memory

Ilgweon Kim, Sangyeon Han, Kwangseok Han, Jongho Lee, Hyungcheol Shin

Journal:

IEEE Electron Device Letters

Year:

1999

Language:

english

File:

PDF, 120 KB

english, 1999

33

[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - 3-D stacked NAND flash memory having lateral bit-line layers and vertical gate

Lee, Ju-Wan, Jeong, Min-Kyu, Park, Byung-Gook, Shin, Hyungcheol, Lee, Jong-Ho

Year:

2012

Language:

english

File:

PDF, 546 KB

english, 2012

34

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Electrical instabilities and low-frequency noise in InGaZnO thin film transistors

Lee, Jon, Kwon, Hyuck-In, Hyungcheol Shin,, Byung-Gook Park,, Young June Park,

Year:

2010

Language:

english

File:

PDF, 374 KB

english, 2010

35

[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2008.06.15-2008.06.16)] 2008 IEEE Silicon Nanoelectronics Workshop - Flicker noise in N-type and P-type silicon nanowire transistors

Yang, Seungwon, Son, Younghwan, Suk, Sung Dae, Kim, Dong-Won, Park, Donggun, Oh, Kyungseok, Shin, Hyungcheol

Year:

2008

Language:

english

File:

PDF, 1.17 MB

english, 2008

36

[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Analysis of low-frequency noise in a-Si:H thin-film transistor by using a unified model

Younghwan Son,, Jaehong Lee,, Jaeho Lee,, Shin, Hyungcheol

Year:

2011

Language:

english

File:

PDF, 260 KB

english, 2011

37

A simple and accurate method for extracting substrate resistance of RF MOSFETs

Jeonghu Han,, Minkyu Je,, Hyungcheol Shin,

Journal:

IEEE Electron Device Letters

Year:

2002

Language:

english

File:

PDF, 207 KB

english, 2002

38

[IEEE IEEE Region 10 Conference. TENCON 99. 'Multimedia Technology for Asia-Pacific Information Infrastructure' - Cheju Island, South Korea (15-17 Sept. 1999)] Proceedings of IEEE. IEEE Region 10 Conference. TENCON 99. 'Multimedia Technology for Asia-Pacific Information Infrastructure' (Cat. No.99CH37030) - Characteristics of P-channel Si nano-crystal memory

Kwangseok Han,, Ilgweon Kim,, Hyungcheol Shin,

Year:

1999

Language:

english

File:

PDF, 204 KB

english, 1999

39

Non-quasi-static small-signal modeling and analytical parameter extraction of SOI FinFETs

In Man Kang,, Hyungcheol Shin,

Journal:

IEEE Transactions on Nanotechnology

Year:

2006

Language:

english

File:

PDF, 475 KB

english, 2006

40

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Characterization of oxide traps by RTN measurement in MOSFETs and memory devices

Shin, Hyungcheol, Byoungchan Oh,

Year:

2010

Language:

english

File:

PDF, 806 KB

english, 2010

41

[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Prediction of channel thermal noise in twin silicon nanowire MOSFET (TSNWFET)

Jaehong Lee,, Jongwook Jeon,, Junsoo Kim,, Byung-Gook Park,, Jong Duk Lee,, Hyungcheol Shin,

Year:

2008

Language:

english

File:

PDF, 1.91 MB

english, 2008

42

[IEEE 2010 68th Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2010.06.21-2010.06.23)] 68th Device Research Conference - Highly scalable vertical bandgap-engineered NAND flash memory

Cho, Seongjae, Kim, Yoon, Shim, Won Bo, Li, Dong Hua, Lee, Jong-Ho, Shin, Hyungcheol, Park, Byung-Gook

Year:

2010

Language:

english

File:

PDF, 1.07 MB

english, 2010

43

[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Non-ideal characteristic analysis of GaN-based light-emitting diode using current-voltage (I–V) and low-frequency noise experiment

Jungjin Park,, Taewook Kang,, Daeyoung Woo,, Joong-Kon Son,, Jong-Ho Lee,, Byung-Gook Park,, Hyungcheol Shin,

Year:

2011

Language:

english

File:

PDF, 297 KB

english, 2011

44

[IEEE ICVC'99. 6th International Conference on VLSI and CAD - Seoul, South Korea (26-27 Oct. 1999)] ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) - 40 nm electron beam patterning and its application to silicon nano-structure fabrication

Sangyeon Han,, Taejnn Park,, Bonkee Kim,, Hyungcheol Shin,, Kwyro Lee,

Year:

1999

Language:

english

File:

PDF, 317 KB

english, 1999

45

MOSFET MODELING AND PARAMETER EXTRACTION FOR RF IC'S

JE, MINKYU, KWON, ICKJIN, SHIN, HYUNGCHEOL, LEE, KWYRO

Journal:

International Journal of High Speed Electronics and Systems

Year:

2001

Language:

english

File:

PDF, 4.80 MB

english, 2001

46

Characterizing traps causing random telegraph noise during trap-assisted tunneling gate-induced drain leakage

Yoo, Sung-Won, Shin, Joonha, Seo, Youngsoo, Kim, Hyunsuk, Jeon, Sangbin, Kim, Hyunsoo, Shin, Hyungcheol

Journal:

Solid-State Electronics

Year:

2015

Language:

english

File:

PDF, 1.02 MB

english, 2015

47

[IEEE ICVC'99. 6th International Conference on VLSI and CAD - Seoul, South Korea (26-27 Oct. 1999)] ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) - Comparison of the characteristics of tunneling oxide and tunneling ON for p-channel nano-crystal memory

Kwangseok Han,, Ilgweon Kim,, Hyungcheol Shin,

Year:

1999

Language:

english

File:

PDF, 336 KB

english, 1999

48

Analysis of Electrothermal Characteristics of GAA Vertical Nanoplate-Shaped FETs

Son, Dokyun, Myeong, Ilho, Kim, Hyunsuk, Kang, Myounggon, Jeon, Jongwook, Shin, Hyungcheol

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 1.51 MB

english, 2018

49

L-Shaped Tunneling Field-Effect Transistors for Complementary Logic Applications

KIM, Sang Wan, CHOI, Woo Young, SUN, Min-Chul, KIM, Hyun Woo, LEE, Jong-Ho, SHIN, Hyungcheol, PARK, Byung-Gook

Journal:

IEICE Transactions on Electronics

Year:

2013

Language:

english

File:

PDF, 2.81 MB

english, 2013

50

Fringe Capacitance Modeling in NanoPlate MOSFET Using Conformal Mapping

Kim, Jongsu, Kang, Myounggon, Jeon, Jongwook, Shin, Hyungcheol

Journal:

IEEE Transactions on Electron Devices

Year:

2019

Language:

english

File:

PDF, 1.25 MB

english, 2019

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